A Method for Trading off Test Time, Area and Fault Coverage in Datapath BIST Synthesis
نویسندگان
چکیده
This paper presents a method for deriving a BIST specification from the initial specification of datapaths. This method minimizes BIST area overhead under test time constraint while guaranteeing a user chosen fault coverage. The designer can thus explore a wide range of solutions and keep the one that best fits with design constraints. Results show great improvements over lower level techniques.
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عنوان ژورنال:
- J. Electronic Testing
دوره 17 شماره
صفحات -
تاریخ انتشار 2001